Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect

Akay D., Alkan S., Altin Z., Gökmen U., Ocak S. B.

RADIATION PHYSICS AND CHEMISTRY, vol.216, pp.1-19, 2024 (SCI-Expanded, Scopus)

• Publication Type: Article / Article
• Volume: 216
• Publication Date: 2024
• Doi Number: 10.1016/j.radphyschem.2023.111392
• Journal Name: RADIATION PHYSICS AND CHEMISTRY
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Pollution Abstracts, Civil Engineering Abstracts
• Page Numbers: pp.1-19
• Ankara University Affiliated: Yes