Akay, D. Et Al. 2024. Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect. RADIATION PHYSICS AND CHEMISTRY , vol.216 , 1-19.

Akay, D., Alkan, S., Altin, Z., Gökmen, U., & Ocak, S. B., (2024). Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect. RADIATION PHYSICS AND CHEMISTRY , vol.216, 1-19.

Akay, DEFNE Et Al. "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect," RADIATION PHYSICS AND CHEMISTRY , vol.216, 1-19, 2024

Akay, DEFNE Et Al. "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect." RADIATION PHYSICS AND CHEMISTRY , vol.216, pp.1-19, 2024

Akay, D. Et Al. (2024) . "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect." RADIATION PHYSICS AND CHEMISTRY , vol.216, pp.1-19.

@article{article, author={DEFNE AKAY Et Al. }, title={Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect}, journal={RADIATION PHYSICS AND CHEMISTRY}, year=2024, pages={1-19} }