Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect


Akay D., Alkan S., Altin Z., Gökmen U., Ocak S. B.

RADIATION PHYSICS AND CHEMISTRY, vol.216, pp.1-19, 2024 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 216
  • Publication Date: 2024
  • Doi Number: 10.1016/j.radphyschem.2023.111392
  • Journal Name: RADIATION PHYSICS AND CHEMISTRY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Pollution Abstracts, Civil Engineering Abstracts
  • Page Numbers: pp.1-19
  • Ankara University Affiliated: Yes