A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors


YÜCEL H., Birgul O., Uyar E., Cubukcu S.

NUCLEAR ENGINEERING AND TECHNOLOGY, cilt.51, sa.3, ss.731-737, 2019 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 51 Sayı: 3
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.net.2018.12.024
  • Dergi Adı: NUCLEAR ENGINEERING AND TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.731-737
  • Anahtar Kelimeler: CdZnTe, Electron mobility, Mobility-lifetime product, Transient pulse, Rise time, Charge Carrier, Digital pulse processing, PERFORMANCE, TIME
  • Ankara Üniversitesi Adresli: Evet

Özet

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.