Atıf İçin Kopyala
YÜCEL H., Birgul O., Uyar E., Cubukcu S.
NUCLEAR ENGINEERING AND TECHNOLOGY, cilt.51, sa.3, ss.731-737, 2019 (SCI-Expanded)
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Yayın Türü:
Makale / Tam Makale
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Cilt numarası:
51
Sayı:
3
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Basım Tarihi:
2019
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Doi Numarası:
10.1016/j.net.2018.12.024
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Dergi Adı:
NUCLEAR ENGINEERING AND TECHNOLOGY
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Derginin Tarandığı İndeksler:
Science Citation Index Expanded (SCI-EXPANDED), Scopus
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Sayfa Sayıları:
ss.731-737
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Anahtar Kelimeler:
CdZnTe, Electron mobility, Mobility-lifetime product, Transient pulse, Rise time, Charge Carrier, Digital pulse processing, PERFORMANCE, TIME
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Ankara Üniversitesi Adresli:
Evet
Özet
In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.