Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

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KETENOĞLU D., Harder M., Klementiev K., Upton M., Taherkhani M., Spiwek M., ...Daha Fazla

JOURNAL OF SYNCHROTRON RADIATION, cilt.22, ss.961-967, 2015 (SCI-Expanded) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 22
  • Basım Tarihi: 2015
  • Doi Numarası: 10.1107/s1600577515009686
  • Dergi Adı: JOURNAL OF SYNCHROTRON RADIATION
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.961-967
  • Anahtar Kelimeler: resonant inelastic X-ray scattering (RIXS), high energy-resolution, diced crystal analyzers, quartz, BACKSCATTERING, ANALYZERS, CRYSTALS
  • Ankara Üniversitesi Adresli: Evet

Özet

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.