Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
JOURNAL OF SYNCHROTRON RADIATION, cilt.22, ss.961-967, 2015 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 22
- Basım Tarihi: 2015
- Doi Numarası: 10.1107/s1600577515009686
- Dergi Adı: JOURNAL OF SYNCHROTRON RADIATION
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.961-967
- Anahtar Kelimeler: resonant inelastic X-ray scattering (RIXS), high energy-resolution, diced crystal analyzers, quartz, BACKSCATTERING, ANALYZERS, CRYSTALS
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- Ankara Üniversitesi Adresli: Evet
Özet
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.