Construction of a spherically bent crystal analyzer through anodic bonding for a non-resonant inelastic X-ray scattering spectrometer


KETENOĞLU D.

INSTRUMENTATION SCIENCE & TECHNOLOGY, cilt.49, sa.5, ss.545-559, 2021 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 49 Sayı: 5
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1080/10739149.2021.1910835
  • Dergi Adı: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, BIOSIS, Biotechnology Research Abstracts, Chemical Abstracts Core, Compendex, INSPEC
  • Sayfa Sayıları: ss.545-559
  • Anahtar Kelimeler: Anodic bonding, inelastic X-ray scattering, spherically bent crystal analyzer, X-ray Raman scattering
  • Ankara Üniversitesi Adresli: Evet

Özet

The anodic bonding method was used to construct spherically bent crystal analyzers for a synchrotron radiation based non-resonant inelastic X-ray scattering spectrometer to probe the local electronic and molecular structure. In order to test the performance of the fabricated analyzers, the O K-edge X-ray Raman scattering spectrum of a lithium-ion battery electrolyte solution was measured and compared to the spectrum in the literature, which was measured by using a conventional X-ray absorption spectroscopy. The X-ray Raman scattering spectrometer based on a 1 m Rowland circle provided to record the data with a resolution of 0.8 eV at similar to 10 keV. The obtained experimental results showed that the anodic bonding was achieved with a high bonding quality.