Preparation of Fine-Grained Silicon-Nitride Ceramics and their Characterization by Depth-Sensing Indentation Tests
ACTA PHYSICA POLONICA A, vol.128, no.2B, pp.355-359, 2015 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 128 Issue: 2B
- Publication Date: 2015
- Doi Number: 10.12693/aphyspola.128.b-355
- Journal Name: ACTA PHYSICA POLONICA A
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Page Numbers: pp.355-359
- Ankara University Affiliated: No
Abstract
Both pressureless-sintered and dense, fine-grained silicon nitride ceramics were produced from mechanochemically activated nitride-based precursors. Scanning Electron Microscopy (SEM), Transmition Electron Microscopy (TEM), X-Ray Diffraction (XRD) and an ultra-low load microhardness tester were used to characterize these ceramics. Depth-sensing indentation (DSI) tests in the range of 200-1800 mN were performed on the silicon nitride ceramic to determine dynamic hardness (H-d) and reduced elastic modulus (E-r) values. These values were deduced by analyzing the unloading segments of the DSI curves. It was found that both H-d and E-r exhibits a significant indentation load dependence. Nix-Gao (NG) model was used to analyze the dynamic hardness data in the calculation of the load independent hardness value.