Low-field magnetic behavior of LaMn2-xNixSi2 silicides


Gencer A., Kilic A., Kervan S.

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, cilt.241, sa.15, ss.3645-3649, 2004 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 241 Sayı: 15
  • Basım Tarihi: 2004
  • Doi Numarası: 10.1002/pssb.200402101
  • Dergi Adı: PHYSICA STATUS SOLIDI B-BASIC RESEARCH
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.3645-3649
  • Ankara Üniversitesi Adresli: Evet

Özet

We have performed X-ray diffraction (XRD) and AC magnetic susceptibility measurements on polycrystalline LaMn2-xNixSi2 (0.0 less than or equal to x less than or equal to 2.0) silicides for magnetic characterization in fields of about a few Oe at a temperature range 15-325 K. All compounds crystallize in the naturally layered ThCr2Si2-type structure with the space group I4/mmm. Substitution of Ni for Mn leads to a linear decrease in the lattice constant c and the unit cell volume, while it gives rise to a change of magnetic properties from ferromagnetic to antiferromagnetic behavior for small values of x < 1. The sample with x = 0.8 has a Neel temperature of about 35 K, associated with anti-ferromagnetic behavior. However. for x = 1. anti-ferromagnetic behavior is diminished and paramagnetic behavior becomes dominant. For x = 2. the sample becomes virtually nonmagnetic. The samples with x less than or equal to 0.5 exhibit mixed magnetic properties composed of ferromagnetic and anti-ferromagnetic interactions, below the Curie temperature T-C(Mn). The results are collected in the magnetic phase diagram. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.