The influence of thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage

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Askerzade İ.

LOW TEMPERATURE PHYSICS, vol.44, no.3, pp.210-212, 2018 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 44 Issue: 3
  • Publication Date: 2018
  • Doi Number: 10.1063/1.5024537
  • Journal Name: LOW TEMPERATURE PHYSICS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.210-212
  • Ankara University Affiliated: Yes

Abstract

In this study we carried out the analysis of the thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage. It was shown that, charge fluctuation is determined by the energy ratio-parameter of small size Josephson junction, temperature and growing rate of voltage. Published by AIP Publishing.