The influence of thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage
LOW TEMPERATURE PHYSICS, cilt.44, sa.3, ss.210-212, 2018 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 44 Sayı: 3
- Basım Tarihi: 2018
- Doi Numarası: 10.1063/1.5024537
- Dergi Adı: LOW TEMPERATURE PHYSICS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.210-212
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- Ankara Üniversitesi Adresli: Evet
Özet
In this study we carried out the analysis of the thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage. It was shown that, charge fluctuation is determined by the energy ratio-parameter of small size Josephson junction, temperature and growing rate of voltage. Published by AIP Publishing.