Investigation of LaMn2-xFexSi2 (0 <= x <= 1.2) by Magnetic Measurements and Neutron Diffraction

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Elerman Y., ELMALI A., Dincer I., Ehrenberg H., Fuess H., Daoud-Aladine A.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, cilt.61, 2005 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Özet
  • Cilt numarası: 61
  • Basım Tarihi: 2005
  • Doi Numarası: 10.1107/s0108767305083583
  • Dergi Adı: ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED)
  • Anahtar Kelimeler: rare-earth manganese silicides, layered structure, neutron diffraction
  • Ankara Üniversitesi Adresli: Evet