Influence of surface roughness on the electrical conductivity of semiconducting thin films

KETENOĞLU D., Unal B.

PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS, cilt.392, sa.14, ss.3008-3017, 2013 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 392 Sayı: 14
  • Basım Tarihi: 2013
  • Doi Numarası: 10.1016/j.physa.2013.03.007
  • Dergi Adı: PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.3008-3017
  • Anahtar Kelimeler: Roughness scattering, Boltzmann transport equation, Semiconducting thin film, Conductivity, INTERFACE-ROUGHNESS, METALLIC-FILMS, GRAIN-BOUNDARY, TRANSPORT, RESISTIVITY, SCATTERING, MOBILITY, TEMPERATURE, CROSSOVER, EQUATION
  • Ankara Üniversitesi Adresli: Evet

Özet

The Green function solution of the Boltzmann transport equation has been applied in case of no magnetic field by ignoring any volume impurities. Gaussian, exponential and power law models for the surface roughness correlation function have been studied and the results have been compared with the ones obtained by other methods. It has been found that the electrical conductivity a increases with increasing correlation length I for the first two models, while for the third model a value is of the same order as the first two models. Therefore we show that the shape of the surface roughness can strongly influence the electrical properties. (C) 2013 Elsevier B.V. All rights reserved.