A Detailed Study on Thickness Calculation of In-Doped SnO2 Thin Films Using A Simple Analysis Method.

GÜRAKAR S., SERİN S. T.

International Congress on Semiconductor Materials Devices (ICSMD 2017), 17-19 August 2017, 17 - 01 Ağustos 2017

  • Yayın Türü: Bildiri / Özet Bildiri
  • Ankara Üniversitesi Adresli: Evet