Akademik Veri Yönetim Sistemi
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2025 (SCI-Expanded, Scopus)
The search for effective radiation shielding materials has gained momentum with the increased use of radiation sources in various sectors. This study discusses the shielding capabilities of 13 pre-formed glass structures by adding SnO2, TiO2, GeO2, TeO2, Rb2O, K2O, and Li2O oxides in similar proportions to sodium silicate (Na2O-SiO2)-based glass structures using software. The SRIM and PAGEX codes were used to study the interactions of charged particles, such as alpha particles and protons, and calculate mass stopping power (MSP), KERMA (Kinetic Energy Released per Unit Mass), and projected range (PR) values. The Phy-X/PSD software was used to estimate the shielding parameters, such as half value layer (HVL), tenth value layer (TVL), linear attenuation coefficient (LAC), mean free path (MFP), mass attenuation coefficient (MAC), fast neutron removal cross section (FNRCS), effective electron density (Neff), equivalent atomic number (Zeq), and effective atomic number (Zeff). Sample S1 (30%Na2O10% SnO260% SiO2) with a density of 2.840 g cm-3 exhibited better shielding performance than the other examined samples, with the lowest MFP, HVL, and TVL and higher LAC values. The higher TVL and HVL values were obtained in sample S13 (1.25% Na2O-23.75% Li2O-75% SiO2). For example, at an energy of 1 MeV, the lowest HVL value of 3.925 cm was obtained for sample S1, while the highest value of 4.743 cm was obtained for sample S13 (1.25% Na2O-23.75% Li2O-75% SiO2). The findings show that Na2O-SnO2 and SiO2 oxides form a good combination in shielding processes.