Escape rate in ac SQUID on Josephson junction based on single- and multi-band superconductors in thermal activation regime Частота розпадів у НКВІД з джозефсонівськими контактами, що базуються на однота багатозонних надпровідниках у термоактивованому режимі

AYDIN A., ASKERBEYLİ İ., Askerbeyli R.

Fizika Nizkikh Temperatur, cilt.49, sa.9, ss.1107-1111, 2023 (Scopus) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 49 Sayı: 9
  • Basım Tarihi: 2023
  • Dergi Adı: Fizika Nizkikh Temperatur
  • Derginin Tarandığı İndeksler: Scopus
  • Sayfa Sayıları: ss.1107-1111
  • Anahtar Kelimeler: critical current, escape rate, Josephson junction, thermal activation regime
  • Ankara Üniversitesi Adresli: Evet

Özet

The escape rate of S→R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors.