Ozdemir, O. Et Al. 2006. Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497, no.1-2 , 149-156.

Ozdemir, O., Atilgan, I., AKAOĞLU, B., SEL, K., & Katircioglu, B., (2006). Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497, no.1-2, 149-156.

Ozdemir, O Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure," THIN SOLID FILMS , vol.497, no.1-2, 149-156, 2006

Ozdemir, O Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, no.1-2, pp.149-156, 2006

Ozdemir, O. Et Al. (2006) . "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, no.1-2, pp.149-156.

@article{article, author={O Ozdemir Et Al. }, title={Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure}, journal={THIN SOLID FILMS}, year=2006, pages={149-156} }