Safran, S. Et Al. 2020. Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties. Journal of Materials Science: Materials in Electronics , vol.31, no.22 , 20578-20588.

Safran, S., Bulut, F., Nefrow, A. R. A., Ada, H., & Ozturk, O., (2020). Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties. Journal of Materials Science: Materials in Electronics , vol.31, no.22, 20578-20588.

Safran, SERAP Et Al. "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties," Journal of Materials Science: Materials in Electronics , vol.31, no.22, 20578-20588, 2020

Safran, SERAP Et Al. "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties." Journal of Materials Science: Materials in Electronics , vol.31, no.22, pp.20578-20588, 2020

Safran, S. Et Al. (2020) . "Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties." Journal of Materials Science: Materials in Electronics , vol.31, no.22, pp.20578-20588.

@article{article, author={SERAP SAFRAN Et Al. }, title={Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties}, journal={Journal of Materials Science: Materials in Electronics}, year=2020, pages={20578-20588} }